Research & Services | The Unit for Nanoscopic Characterization

Popov Inna, HUJI, Faculty of Science, The Center for Nanoscience and Nanotechnology



Nanoscience, nanotechnology, electron microscopy, scanning probe microscopy, X-ray characterization, surface-checmical analysis



  • Develop and operate user-oriented analytical facilities
  • Aid researchers from the University and external customers in performing a variety of characterization measurements
  • Support multidisciplinary research and "hands-on" technological education at The Hebrew University

Research provided

  • The unit provides advanced equipment for:
  • Electron microscopy, scanning probe microscopy, X-ray characterization, and advanced surface-chemical analysis of materials.
  • The UNC also provides equipment needed for specimen preparation for the above-mentioned characterization facilities.
  • A highly-qualified, experienced staff is available to assist with all projects
  • Training courses for users who wish to learn how to use and operate the facilities of the unit 


  • Fully equipped with state-of-the-art instruments, staffed by experienced, service-oriented professionals

Available equipment

  • Transmission Electron Microscope - Tecnai F20 G2 (TEM)
  • High-Resolution Scanning Electron Microscope - Sirion (HR-SEM)
  • Environmental Scanning Electron Microscope - QUANTA 200(ESEM)
  • X-Ray Diffractometer - D8 Advance (XRD)
  • Scanning Probe Microscope - Nanoscope Dimension 3100 (SPM)
  • X-Ray Photoelectron and Auger Spectroscope - Axis Ultra (XPS & Auger) 


  • The unit maintains a staff of engineers, research fellows, a technical manager and a technical engineer


Inna Popov, PhD, innap@savion.huji.ac.il

Link to homepage http://nanoscience.huji.ac.il/unit/index.htm



Contact for more information:

Itzik Goldwaser
VP, Head of Research Collaborations
Contact ME: