Objective

• Develop and operate user-oriented analytical facilities
• Aid researchers from the University and external customers in performing a variety of characterization measurements
• Support multidisciplinary research and "hands-on" technological education at The Hebrew University

Research provided

• The unit provides advanced equipment for:
• Electron microscopy, scanning probe microscopy, X-ray characterization, and advanced surface-chemical analysis of materials.
• The UNC also provides equipment needed for specimen preparation for the above-mentioned characterization facilities.
• A highly-qualified, experienced staff is available to assist with all projects
• Training courses for users who wish to learn how to use and operate the facilities of the unit 

Advantages

• Fully equipped with state-of-the-art instruments, staffed by experienced, service-oriented professionals

Available equipment

• Transmission Electron Microscope - Tecnai F20 G2 (TEM)
• High-Resolution Scanning Electron Microscope - Sirion (HR-SEM)
• Environmental Scanning Electron Microscope - QUANTA 200(ESEM)
• X-Ray Diffractometer - D8 Advance (XRD)
• Scanning Probe Microscope - Nanoscope Dimension 3100 (SPM)
• X-Ray Photoelectron and Auger Spectroscope - Axis Ultra (XPS & Auger) 

Staff

• The unit maintains a staff of engineers, research fellows, a technical manager and a technical engineer

Contact

Inna Popov, PhD, innap@savion.huji.ac.il

Link to homepage http://nanoscience.huji.ac.il/unit/index.htm